Treier S., Lukas R., Hund A., Kirchgessner N., Aasen H., Walter A., Herrera Mourente J. M.
Digital lean phenotyping methods in the context of wheat variety testing.
In: North American Plant Phenotyping Network (NAPPN) Annual Conference. 14 February, Hrsg. NAPPN, West Lafayette, Indiana (USA). 2024.
Publikations-ID (Webcode): 57541 Per E-Mail versenden
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